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COXEM Targets Semiconductor Inspection Market

Published

8 November 2026

Topic

opportunities

◆ Sectors

Semiconductors

◆ Geography

South Korea

◆ Source

Read at thelec.net →

◆ Verified

Fusion42 · 8 November 2026 · Fusion42 review

COXEM and Hanbit Laser have partnered to develop automated inline semiconductor wafer inspection equipment using atmospheric-pressure scanning electron microscope technology, aiming to inspect 300mm wafers without vacuum environments and detect nanometer-scale defects. This tech targets the growing demand for microscopic defect inspection in advanced packaging products like high-bandwidth memory.

This Wire brief sits within Fusion42's coverage of Semiconductors.

◆ ◆ The Wire takeaway

You must rethink semiconductor inspection to include atmospheric-pressure SEM, which cuts vacuum prep time and fits advanced packaging like HBM. This technology opens a fresh route to offer inspection solutions to semiconductor makers refining wafer-level defect detection.

◆ Coverage

1 source · 8 Nov 2026

◆ Related on Wire

◆ Topics

Semiconductorselectron-microscopesemiconductor-inspectioncooperationnew-technology300mm-wafers