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Wire · opportunities

Compact photonic chip enables three-dimensional OCT inspection for industrial samples

30 September 2026 · By · Wire by Fusion42

Published

30 September 2026

Topic

opportunities

◆ Sectors

Photonics & Optics

◆ Geography

China

◆ Source

Read at eurekalert.org →

◆ Verified

Fusion42 · 30 September 2026 · Fusion42 review

Researchers at Shanghai Jiao Tong University have developed a compact 0.36-mm² photonic chip enabling high-precision three-dimensional swept-source optical coherence tomography (SS-OCT) for industrial inspection, including contactless measurement within confined spaces using a ball-lens fiber probe.

This Wire brief sits within Fusion42's coverage of Photonics & Optics.

◆ ◆ The Wire takeaway

You now have a compact, industrial-grade OCT module that fits restricted spaces and cuts complexity by integrating optics on chip. This opens up inspection opportunities where contact or bulky systems blocked you before.

◆ Coverage

1 source · 30 Sep 2026

◆ Related on Wire

◆ Topics

Photonics & Opticsphotonic-chipss-octindustrial-inspectioncontactless-measurementintegrated-optics